​              Dr. Raúl Eduardo  Balderas Navarro

              

Educación

Abril, 1998, Doctorado en Ciencias Aplicadas, Facultad de Ciencias UASLP.

Puestos Académicos-Administrativo

Coordinador del Posgrado PNPC en Ciencias Aplicadas de la Universidad Autónoma de San Luis Potosí, del julio de 2007 a agosto de 2008, Enero 2015- Diciembre 2016.


Dirección de Tesis:

Licenciatura 23

Maestría 22

Doctorado 6


Premios

Primer Lugar en el Certamen: "Premio Anual en Ciencias FRANCISCO ESTRADA", con el trabajo titulado: "Diseño y construcción de un espectrómetro para la medición de espectros de reflectancia diferencial, 20 de noviembre de 1992, San Luis Potosí SLP.

Beca  de la  Sociedad  Austriaca  para la realización de estudios posdoctorales. Octubre de 1999-octubre de 2000, Linz, Austria.

Arbitro de la Revista Journal of Optics desde Abril 2011.

Arbitro de la Revista Thin Solid Films desde Mayo 2011.

Arbitro de proyectos SEP-CONACyT desde 2006.

Arbitro de la Revista Journal of Appl. Physics desde Marzo  2014


Publicaciones

1) "A spectrometer for the measurement of reflectance-difference spectra", L.F. Lastras- Martínez, R.E. Balderas-Navarro and A. Lastras-Martínez, Rev. Sci. Instrum. 64 (8), 2147 (1993).

2) "Surface potential inversion of thermal annealed  GaAs  (001)  observed  by  reflectance-difference spectroscopy", R.E. Balderas- Navarro, M. A. Vidal-Borbolla, A. Lastras- Martínez and L.F. Lastras- Martínez, Revista Mexicana de Fisica 40, 1 (1994).

3) "Model  for  the  linear  electro-optic  reflectance-difference spectrum of GaAs(001) around E1  and E1+D1", A. Lastras- Martínez, R.E. Balderas-Navarro, L.F. Lastras- Martínez and M. A. Vidal-Borbolla, Phys. Rev. B 59, 10234 (1999).

4)"Photoreflectance spectroscopy of CdTe(001) around E1 and E1+D1: linear electro-optic spectrum", A. Lastras-Martínez, R.E. Balderas-Navarro, P. Cantú-Alejandro and L.F. Lastras- Martínez, J. Appl. Phys. 86, 2062 (1999).

5)"Linear Electro-optic Photoreflectance Spectra of GaAs and CdTe around E1 and E1+D1", A. Lastras-Martínez, R.E. Balderas- Navarro, P. Cantú-Alejandro and L.F. Lastras- Martínez, Phys. Stat. Sol. (a), 175, 45 (1999).

6) "Linear electro-optic reflectance modulated spectra  of  GaAs (001) around E1 and E1+D1", A. Lastras-Martínez, R.E. Balderas- Navarro and L.F. Lastras- Martínez, Thin Solid Films 373, 207 (2000).

7) "In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy", Balderas-Navarro RE, Hingerl K, Hilber W, Stifter D, Bonanni A, Sitter H. Journal of Vacuum Science and Technology B18 (4), 2224-2228 (2000).

8)"Surface-stress-induced optical bulk anisotropy", Hingerl K, Balderas-Navarro RE, Hilber W, Bonanni A, Stifter D., Physical Review B62, 13048-13052 (2000).

9)"In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance- difference spectroscopy", Balderas Navarro RE, Hingerl K, Bonanni A, H. Siter, and D. Stifter. Applied Physics Letters, 78 (23), 3615-3617 (2001).

10) "On the origin of resonance features in reflectance difference data of silicon", Hingerl K, Balderas-Navarro RE, Bonanni A., and W.G. Schmidt, Applied Surface Science 175, 769-776 (2001).

11) "Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data", K. Hingerl, R. E. Balderas-Navarro, A. Bonanni, and D. Stifter, Journal of Vacuum Science and Technology B19, 1650-1657 (2001).

12) "Photoreflectance-difference spectroscopy of GaAs (001) under [110] uniaxial stress: linear and quadratic electro-optic components", L.F. Lastras-Martinez, M. Chavira-Rodriguez, A. Lastras-Martinez and R.E. Balderas-Navarro, Phys. Rev. B. 66075315 (2002).

13) "In situ optical techniques for monitoring the formation of nanostructures", Hingerl K; Bonanni A; Balderas R; PHYSICA STATUS SOLIDI B-BASIC RESEARCH Volume: 232 Issue: 1 Pages: 13-23, DOI: 10.1002/1521-3951(200207)232:1<13::AID- PSSB13>3.0.CO;2-G (2002).

14) "Reflectance difference spectroscopy during CdTe/ZnTe interface formation", Balderas-Navarro RE; Hingerl K; Stifter D, APPLIED SURFACE SCIENCE Volume: 190, Issue: 1-4, Pages: 307-310, A r t i c l e N u m b e r :  PII S 0 1 6 9 -4332(01)00897-2  DOI: 10.1016/S0169-4332(01)00897-2 (2002).

15) "Surface-induced d-band anisotropy on Cu(110)", Sun LD, Hohage M, Zeppenfeld P, Balderas-Navarro RE, Hingerl K. SURFACE SCIENCE 527 (1-3): L184-L190 (2003).

16) "RDS investigatiosn of adsorption and surface ordering processes on cu(110)" Sun L D, Hohage M, Zeppenfield P and Balderas- Navarro R E 2003 Phys. Status Solidi c (0) 3022.

17) "Enhanced optical sensitivity to adsorption due to depolarization of anisotropic surface states" Sun LD, Hohage M, Zeppenfeld P, Balderas-Navarro RE, Hingerl K. PHYSICAL REVIEW LETTERS 90 (10) pp. 106104 (2003).

18) "Strain induced optical  anisotropies  in  zincblende semiconductors", L. F. Lastras-Martínez, R.E. Balderas-Navarro, M. Chavira-Rodríguez, J.M. Flores-Camacho and A. Lastras- Martínez, phys. Stat. Sol. (b) 240, 500-508 (2003).

19) "Growth of self-assembled InAs quantum dots on Si exposed GaAs substrates by molecular beam epitaxy", Saucedo-Zeni N, Zamora-Peredo L,  Gorbatchev  AY,  Lastras- Martinez A, Balderas-Navarro R, Medel-Ruiz CI,at. al., JOURNAL OF CRYSTAL G R OW TH , Vol  251(1-4),  201-207  (2003),  DOI: 10.1016/S0022-0248(02)02133-4.

20) "Model for t he strain-induced reflectance-difference spectra of  InGaAs/GaAs  (001) epitaxial layers", A. Lastras-Martínez, R.E. Balderas-Navarro, C.I. Medel-Ruiz, J.M. Flores- Camacho, A. Gaona-Couto, and L.F. Lastras-Martínez, phys. stat. sol. (c)  0,  2987-2991 (2003).

21) "In situ monitoring of  the  2D–3D  growth-mode  transition  in In0.3Ga0.7As/GaAs  (001) by reflectance-difference spectroscopy" C.I. Medel-Ruiz, A. Lastras-Martínez, R.E. Balderas- Navarro, S.L. Gallardo, V.H. Mendez-García, J.M. Flores-Camacho, A. Gaona-Couto, L.F. Lastras-Martínez, Appl. Surf. Sci.  221 48-52 (2004).

22) "Reflectance difference spectroscopy of GaAs(001) under a [110] uniaxial stress", L.F. Lastras-Martínez , M. Chavira-Rodríguez, R.E. Balderas-Navarro, J.M. Flores-Camacho and A. Lastras- Martínez, Phys. Rev. B 70, 035306 (2004).

23) "Stress-induced optical anisotropies measured by modulated reflectance", L F Lastras-Martínez, R. E. Balderas-Navarro, A. Lastras-Martínez and K. Hingerl, Semicond. Sci. Technol. 19 (2004) R35-R46.

24)  "Origin  and  temperature  dependence  of  the  surface  optical anisotropy on Cu(110)" Sun LD, Hohage M, Zeppenfeld P, Balderas-Navarro RE, SURFACE SCIENCE Vol589(1-3), 153- 163 DOI: 10.1016/j.susc.2005.05.059 (2005).

25) "Interfaces in GaxIn1-xAsySb1-y/AlxGa1-xAsySb1-y multi- quantum  well heteroestructures probed by transmittance anisotropy spectroscopy", E.A. Cerda, R E Balderas- Navarro, A. Lastras-Martínez, L F Lastras-Martínez, A. Garnache, L. Cerutti and A. Jouille, JOURNAL OF APPLIED PHYSICS 98, 066107 (2005).

26) "Surface strain induced by reconstructed surfaces of GaAs (001) measured by photoreflectance- and reflectance-difference spectroscopies", L F Lastras-Martínez, J.M. Flores- Camacho, A. Lastras-Martínez, R E Balderas-Navarro, and M. Cardona, Phys. Rev. Lett. 96 (4): Art. No. 047402 FEB 3 2006.

27)  "Strain Oscillations Probed with Light", Phys. Rev. Lett. 96,016105 (2006), L. D.  Sun1, M. Hohage, P. Zeppenfeld, R. E. Balderas-Navarro, and K. Hingerl.

28) "Reconstruction Induced Surface Strain in GaAs (001) Surfaces Characterized by Reflectance Modulated Spectroscopies", L. F. Lastras-Martínez, J. M. Flores-Camacho, R. E. Balderas-Navarro, A. Lastras-Martínez, and M. Cardona, AIP Conf. Proc. 893, 11- 12 (2007).

29) "Reflectance difference spectroscopy as an optical probe for the in situ determination of doping  levels  in  GaAs",  Lastras- Martinez,  A.;  Lara-Velazquez,   I.;   Balderas-Navarro, R.E.; Ortega-Gallegos, J.; Lastras-Martinez, L.F.; Electronics and Photonics, 2006. MEP 2006. Multiconference on, 7-10 Nov. 2006 Page(s):4–7 Digital Object Identifier 10.1109/MEP.2006.335613.

30) "Effect of recontruction-induced  strain  on  the  reflectance difference spectroscopy of GaAs (001) around E1  and E1+  1 transitions", L F Lastras-Martínez, J.M. Flores-Camacho, R E Balderas-Navarro, M. Chavira-Rodríguez, A. Lastras-Martínez and M. Cardona, Phys. Rev. B. 75, 235315 (2007).

31)  "Reflectance difference spectrometer based on the use of a CCD camera", L. F. Lastras- Martínez,  R.  Castro-García,  R.   E. Balderas-Navarro,   and   A.   Lastras-Martínez,   Proc. SPIE V o l . 6422, 64221C. (May. 16, 2007).

32) "Reflectance-difference spectroscopy as an optical probe for the in situ determination of doping levels in GaAs", A. Lastras- Martínez, I. Lara-Velázquez, R. E. Balderas-Navarro, J. Ortega- Gallegos, and L. F.  Lastras-Martínez Proc.  SPIE Vol.  6422, 64221H (May. 16, 2007).

33) "Reflectance-difference spectroscopy as an optical probe for in situ determination of doping levels in GaAs", A. Lastras- Martínez, I. Lara-Velázquez, R. E. Balderas-Navarro, J. Ortega- Gallegos, S. Guel-Sandoval, L. F. Lastras-Martínez, phys. stat. sol. (c) 5, No. 8, 2565–2568 (2008).

34) "Optical anisotropy induced by mechanical strain around the fundamental gap of GaAs" J. Ortega-Gallegos, A. Lastras- Martínez, L. F. Lastras-Martínez, R. E. Balderas-Navarro phys. stat. sol. (c) 5, No. 8, 2561–2564 (2008).

35) "Reflectance-anisotropy study of  the  dynamics  of  molecular beam epitaxy growth of GaAs and InGaAs on GaAs (001)" J. Ortega-Gallegos, A. Lastras-Martínez, L. F. Lastras- Martínez, R. E.  Balderas-Navarro  phys.  stat.  sol.  (c)  5,  No.  8, 2573–2577 (2008).

36)  "Surface strain contributions to the lineshapes of reflectance difference spectra for one- electron and discrete-exciton transitions" L. F. Lastras-Martínez, J. Ortega-Gallegos, R. E. Balderas-Navarro, J. M. Flores-Camacho, M. E. Chavira- Rodríguez, A. Lastras-Martínez, M. Cardona, phys. stat. sol. (c) 5, No. 8, 2591–2594 (2008).

37)  "One electron and discrete excitonic contributions to the optical response of semiconductors around E1 transition: analysis in the reciprocal space", L. F. Lastras-Martínez,1, R.E. Balderas- Navarro, J. Ortega-Gallegos, Lastras-Martínez, J. M. Flores- Camacho and K. Hingerl, J. Opt. Soc. Am. B 26, 725-733 (2009).

38) "Micro-reflectance difference spectrometer based on a  charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001)", L. F. Lastras- Martínez, R. Castro-García, R. E. Balderas-Navarro and A. Lastras-Martínez, Applied Optics, Vol. 48, Issue 30, pp. 5713-5717 (2009).

39) "Study of the molecular beam "epitaxial growth of InAs on Si- covered GaAs(100) substrates", Mendez-Garcia VH, Saucedo- Zeni N, Balderas R, Lopez-Lopez, JOURNAL OF CRYSTAL GROWTH, Volume: 311(6), 1451 (2009)

40)  "Optical anisotropies of Si grown on step-graded SiGe(110) layers", R.E. Balderas-Navarro, L. F. Lastras-Martinez, K. Arimoto, R. Castro-Garcia, O. Villalobos-Aguilar, A. Lastras- Martinez, K. Nakagawa, K. Sawano, Y. Shiraki, N. Usami, and K. Nakajima, Appl. Phys. Lett. 96, 091904 (2010).

41) "Optical characterization of methanol adsorption on the bare and oxygen precovered Cu(110) surface", Sun LD, Demirci E, Balderas-Navarro RE, Winkler A, Hohage M, Zeppenfeld P, SURFACE SCIENCE, Vol 604(9-10), pp: 824-828, (2010).

42)  "Polarization    contrast    linear    spectroscopies   for    cubic semiconductors under stress: macro-  and  micro-reflectance  difference  spectroscopies", L. F. Lastras-Martínez, R. E. Balderas-Navarro, R. Castro-García, R. Herrera-Jasso, M. Chavira-Rodriguez and  A.  Lastras- Martínez, Annalen der Physik, Special Issue: "Optical and Vibrational Spectroscopies" Volume 523, Issue 1-2, pages 121–128, January (2011).

43) "Effects of substrate orientation on the optical anisotropy spectra of GaN/AlN/Si in  the energy range from 2.0 to 3.5 eV", L.F. Lastras-Mtz, R.E. Balderas-Navarro, R. Herrera- Jasso, Y. Cordier, et. al., Journal of Applied Physics 111, 23511 (2012).

44) "Micro reflectance difference techniques: Optical probes for surface exploration", L. F. Lastras-Martínez, O. del Pozo- Zamudio, R. Herrera-Jasso, N.A. Ulloa-Castillo, R.E. Balderas- Navarro, J. Ortega-Gallegos, and A. Lastras-Martínez, Phys. Status Solidi B, Vol, 249(6), 1119–1123, (2012).

45) "MERA: A Micro-Economic Routing Algorithm for Wireless Sensor Networks", Jesús ESQUIVEL-GOMEZ Raúl E. BALDERAS-NAVARRO, Enrique STEVENS-NAVARRO Jesus ACOSTA-ELIAS, Letter (IEICE Trans. Commun, vol.E95- B, no.8, pp.2646-2649, Aug 1, 2012).

46) "A rapid reflectance-difference  spectrometer  for  real-time semiconductor growth monitoring with sub-second time resolution", O. Núñez-Olvera, R.E. Balderas-Navarro, J. Ortega- Gallegos, L. E. Guevara-Macías, A. Armenta-Franco, M.A. Lastras-Montaño, L.F. Lastras- Martínez,   and   A.   Lastras- Martínez, Rev. Sci. Instrum. 83, 103109 (2012).

47) "Polymer-based hybrid integrated optical photochromic switch", M. Gutiérrez, A. Rodríguez- Cobos, R.E. Balderas-Navarro, M. Bello-Jiménez, J.A. Alvarez, G. Ramírez-Flores, S. Guel, L.E Elizalde, R Ledezma, Journal of Scientific & Industrial Research. Vol. 71(08), 539 (2012).

48) "Reflectance anisotropies of compressively strained Si grown on vicinal Si1−xCx(001)", R. E. Balderas-Navarro, N. A. Ulloa- Castillo, K. Arimoto, G. Ramírez-Meléndes, L. F. Lastras- Martínez, H. Furukawa, J. Yamanaka, A. Lastras-Martínez, J. M. Flores-Camacho, N. Usami, D. Stifter,  and  K. Hingerl, Appl. Phys. Lett. 102, 011902 (2013).

49) "Optical characterization of orientation-patterned GaP structures by micro reflectance difference spectroscopy", L. F. Lastras- Martínez, R. Herrera-Jasso, N. A. Ulloa-Castillo, R. E. Balderas- Navarro, A. Lastras-Martínez, Angie C. Lin, M. M. Fejer, and James S. Harris, J. Appl. Phys. 114, 173504 (2013).

50)  "Dots-in-a-well ingaas based laser probed by photoreflectance- anisotropy spectroscopy", 2009 III  IEEE  Students Chapter. ISBN: 978-1-4244-6027-4,   INSPEC   Accession Number: 11155320, DOI: 10.1109/IEEEXPO.2009.5422872.
51) "Optical   waveguide   writing   in   photochromic   material: photoinduced   optical properties by femtosecond laser pulses", 22nd Congress of the International Commission for Optics: Light for the Development of the World, Proc. SPIE 8011, 80113A (2011); doi:10.1117/12.901963.

52) Campos-Cantón, I; Segura-Cisneros, O A; Balderas-Navarro, R E; Campos-Cantón, E., "Chua's circuit and its characterization as a filter", European Journal of Physics, Volume 35, Number 6, November 2014, pp. 65018-65027(10. DOI: http://dx.doi.org/10.1088/0143- 0807/35/6/065018, 2014.

53) Nicolás Ulloa-Castillo, Luis Lastras-Martínez, Raúl BalderasNavarro, Rafael Herrera-Jasso, and Alfonso Lastras-Martínez. "Measurement of the shear strain of the Gd2O3/GaAs(001) nterface by photoreflectance difference spectroscopy", Applied Physics Letters, Vol. 105(18), pp. 181905. November 2014. http://scitation.aip.org/content/aip/journal/apl/105/18/10.1063/1.49011 68, 2014.

54) A. Lastras-Martínez, J. Ortega-Gallegos, L.E. Guevara-Macías, O. Núñez-Olvera, R. Balderas- Navarro, L.F. Lastras-Martínez, L.A. LastrasMontaño, and M.A. Lastras-Montaño, "Real-time reflectance difference spectroscopy of MBE homoepitaxial growth of GaAs", Appl. Phys Mater. Vol. 2, 032107 http://dx.doi.org/10.1063/1.4868519, 2014.

55)  Alejandro Cisneros-de-la-Rosa1, Irving Eduardo Cortes-Mestizo1, Esteban Cruz-Hernández, Víctor Hugo Méndez-García, Luis ZamoraPeredo, José Vulfrano González-Fernández, Raúl Balderas-Navarro, Andrei Yu. Gorbatchev and Máximo López-López., "Effect of surface states on the electrical properties of MBE grown modulation doped AlGaAs/GaAs", J. Vac. Sci. Technol. B 32, 02C110 (2014); http://dx.doi.org/10.1116/1.4863677, 2014.

56) Esquivel-Gómez J.J., Balderas-Navarro R.E., Ugalde E., and AcostaElías J., "On the growth of directed complex networks with preferential attachment: effect upon the prohibition of multiple links.", International Journal of Modern Physics C. Vol. 26, No. 6 (2015) 1550066. DOI: 10.1142/S0129183115500667, 2015.

57) J. Esquivel-Gómez, P.D. Arjona-Villicaña, E. Stevens-Navarro, U. Pineda-Rico, R.E. Balderas- Navarro1 and J. Acosta-Elias., "On a growth model for complex networks capable of producing power-law out-degree distributions with wide range exponents", Scientific Reports 5, Article number: 9067; doi:10.1038/srep09067, 2015.

58) Luis Felipe Lastras-Martínez, Nicolás Antonio Ulloa-Castillo, Rafael Herrera-Jasso, Raúl Eduardo Balderas-Navarro, Alfonso Lastras-Martínez, Mahesh Pandikunta, Oleg Ledyaev, Vladimir Kuryatkov3 and Sergey Nikishin, "Characterization of Si3N4/Si(111) thin films by reflectance difference spectroscopy", 2015 Jpn. J. Appl. Phys. 54 021501; doi:10.7567/JJAP.54.021501, 2015.

59)  Gustavo Ramírez-Meléndez; Miguel Ángel Bello-Jiménez; Christian A. Cuadrado-Laborde; Antonio Díez; José Luis Cruz Muñoz; Amparo Rodríguez Cobos; Raúl E. Balderas-Navarro; Miguel V. Andrés Bou, "Acousto-optic interaction in biconical tapered fibers: shaping of the stopbands", Opt. Eng. 55(3) 036105 doi: 10.1117/1.OE.55.3.036105 Published in: Optical Engineering Volume 55, Issue 3, 2016.

60) J.V.T. Buller, E.A. Cerda-Méndez, R.E. Balderas-Navarro and P.V. Santos., "Dynamical and Tuneable Modulation of the Tamm Plasmon/Exciton–Polariton Hybrid States Using Surface Acoustic Waves", Vol. 129 (2016) ACTA PHYSICA POLONICA A No. 1-A, 2016.

61) JVT Buller, EA Cerda-Méndez, RE Balderas-Navarro, K Biermann1 and PV Santos, "Spatial self-organization of macroscopic quantum states of exciton-polaritons in acoustic lattices ", New J. Phys. 18 073002; http://dx.doi.org/10.1088/1367-2630/18/7/073002, 2016.

62)  J. V. T. Buller, R. E. Balderas-Navarro, K. Biermann, E. A. Cerda-Méndez, and P. V. Santos, Exciton-polariton gap soliton dynamics in moving acoustic square lattices, Phys. Rev. B 94, 125432 (2016).

63)    J. Esquivel-Gómez, R. E. Balderas-Navarro, P. D. Arjona-Villicaña, P. Castillo-Castillo, O. Rico-Trejo, and J. Acosta-Elias, On the Emergence of Islands in Complex Networks, Complexity Volume 2017, Article ID 7157943, 10 pages https://doi.org/10.1155/2017/7157943.

64)  I. Campos-Cantón, E. Campos-Cantón, S. González-Bautista, and R.E. Balderas-Navarro, Experimental multi-scroll attractor driven by switched systems, NSTRUMENTATION, Revista Mexicana de Física 63 (2017) 117–123, MARCH-APRIL 2017.

65) Carlos Guerrero, Tonatiuh Saucedo, Mas. Araiza, Raúl Balderas-Navarro, Alfonso López, and Carlos Olvera, MEASUREMENTS OF CONCENTRATION DIFFERENCES BETWEEN LIQUID MIXTURES USING DIGITAL HOLOGRAPHIC INTERFEROMETRY Metrology and Measurement Systems. Accepted 2016. To be published March 2017.


email: rbn@cactus.iico.uaslp.mx